It takes the average reader 4 hours and 28 minutes to read High Resolution X-Ray Diffractometry and Topography by D K Bowen
Assuming a reading speed of 250 words per minute. Learn more
The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.
High Resolution X-Ray Diffractometry and Topography by D K Bowen is 264 pages long, and a total of 67,056 words.
This makes it 89% the length of the average book. It also has 82% more words than the average book.
The average oral reading speed is 183 words per minute. This means it takes 6 hours and 6 minutes to read High Resolution X-Ray Diffractometry and Topography aloud.
High Resolution X-Ray Diffractometry and Topography is suitable for students ages 12 and up.
Note that there may be other factors that effect this rating besides length that are not factored in on this page. This may include things like complex language or sensitive topics not suitable for students of certain ages.
When deciding what to show young students always use your best judgement and consult a professional.
High Resolution X-Ray Diffractometry and Topography by D K Bowen is sold by several retailers and bookshops. However, Read Time works with Amazon to provide an easier way to purchase books.
To buy High Resolution X-Ray Diffractometry and Topography by D K Bowen on Amazon click the button below.
Buy High Resolution X-Ray Diffractometry and Topography on Amazon