It takes the average reader 3 hours and 41 minutes to read Delay Fault Testing for VLSI Circuits by Angela Krstic
Assuming a reading speed of 250 words per minute. Learn more
With the ever-increasing speed of integrated circuits, violations of the performance specifications are becoming a major factor affecting the product quality level. The need for testing timing defects is further expected to grow with the current design trend of moving towards deep submicron devices. After a long period of prevailing belief that high stuck-at fault coverage is sufficient to guarantee high quality of shipped products, the industry is now forced to rethink other types of testing. Delay testing has been a topic of extensive research both in industry and in academia for more than...
Delay Fault Testing for VLSI Circuits by Angela Krstic is 216 pages long, and a total of 55,296 words.
This makes it 73% the length of the average book. It also has 68% more words than the average book.
The average oral reading speed is 183 words per minute. This means it takes 5 hours and 2 minutes to read Delay Fault Testing for VLSI Circuits aloud.
Delay Fault Testing for VLSI Circuits is suitable for students ages 12 and up.
Note that there may be other factors that effect this rating besides length that are not factored in on this page. This may include things like complex language or sensitive topics not suitable for students of certain ages.
When deciding what to show young students always use your best judgement and consult a professional.
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