It takes the average reader 6 hours and 1 minute to read Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices by Ronald Donald Schrimpf
Assuming a reading speed of 250 words per minute. Learn more
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semi-conductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes...
Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices by Ronald Donald Schrimpf is 349 pages long, and a total of 90,391 words.
This makes it 118% the length of the average book. It also has 110% more words than the average book.
The average oral reading speed is 183 words per minute. This means it takes 8 hours and 13 minutes to read Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices aloud.
Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices is suitable for students ages 12 and up.
Note that there may be other factors that effect this rating besides length that are not factored in on this page. This may include things like complex language or sensitive topics not suitable for students of certain ages.
When deciding what to show young students always use your best judgement and consult a professional.
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