It takes the average reader 1 hour and 51 minutes to read Reliability Prediction from Burn-In Data Fit to Reliability Models by Joseph Bernstein
Assuming a reading speed of 250 words per minute. Learn more
This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions. This book will allow chip designers to predict FIT and DPPM values as a function of operating conditions and chip temperature so that users ultimately will have control of reliability in their design so the reliability and performance will be considered concurrently with their design. The ability to include reliability calculations and test results in their product design The ability to use reliability data provided to them by their suppliers to make meaningful reliability predictions Have accurate failure rate calculations for calculating warrantee period replacement costs
Reliability Prediction from Burn-In Data Fit to Reliability Models by Joseph Bernstein is 108 pages long, and a total of 27,864 words.
This makes it 36% the length of the average book. It also has 34% more words than the average book.
The average oral reading speed is 183 words per minute. This means it takes 2 hours and 32 minutes to read Reliability Prediction from Burn-In Data Fit to Reliability Models aloud.
Reliability Prediction from Burn-In Data Fit to Reliability Models is suitable for students ages 10 and up.
Note that there may be other factors that effect this rating besides length that are not factored in on this page. This may include things like complex language or sensitive topics not suitable for students of certain ages.
When deciding what to show young students always use your best judgement and consult a professional.
Reliability Prediction from Burn-In Data Fit to Reliability Models by Joseph Bernstein is sold by several retailers and bookshops. However, Read Time works with Amazon to provide an easier way to purchase books.
To buy Reliability Prediction from Burn-In Data Fit to Reliability Models by Joseph Bernstein on Amazon click the button below.
Buy Reliability Prediction from Burn-In Data Fit to Reliability Models on Amazon