It takes the average reader 10 hours and 33 minutes to read Semiconductor Process Reliability in Practice by Zhenghao Gan
Assuming a reading speed of 250 words per minute. Learn more
Proven processes for ensuring semiconductor device reliability Co-written by experts in the field, Semiconductor Process Reliability in Practice contains detailed descriptions and analyses of reliability and qualification for semiconductor device manufacturing and discusses the underlying physics and theory. The book covers initial specification definition, test structure design, analysis of test structure data, and final qualification of the process. Real-world examples of test structure designs to qualify front-end-of-line devices and back-end-of-line interconnects are provided in this practical, comprehensive guide. Coverage includes: Basic device physics Process flow for MOS manufacturing Measurements useful for device reliability characterization Hot carrier injection Gate-oxide integrity (GOI) and time-dependent dielectric breakdown (TDDB) Negative bias temperature instability Plasma-induced damage Electrostatic discharge protection of integrated circuits Electromigration Stress migration Intermetal dielectric breakdown
Semiconductor Process Reliability in Practice by Zhenghao Gan is 624 pages long, and a total of 158,496 words.
This makes it 211% the length of the average book. It also has 194% more words than the average book.
The average oral reading speed is 183 words per minute. This means it takes 14 hours and 26 minutes to read Semiconductor Process Reliability in Practice aloud.
Semiconductor Process Reliability in Practice is suitable for students ages 12 and up.
Note that there may be other factors that effect this rating besides length that are not factored in on this page. This may include things like complex language or sensitive topics not suitable for students of certain ages.
When deciding what to show young students always use your best judgement and consult a professional.
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