It takes the average reader 5 hours and 47 minutes to read Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices by Takashi Nakamura
Assuming a reading speed of 250 words per minute. Learn more
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.
Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices by Takashi Nakamura is 343 pages long, and a total of 86,779 words.
This makes it 116% the length of the average book. It also has 106% more words than the average book.
The average oral reading speed is 183 words per minute. This means it takes 7 hours and 54 minutes to read Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices aloud.
Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices is suitable for students ages 12 and up.
Note that there may be other factors that effect this rating besides length that are not factored in on this page. This may include things like complex language or sensitive topics not suitable for students of certain ages.
When deciding what to show young students always use your best judgement and consult a professional.
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