It takes the average reader 1 hour and 35 minutes to read Thermal-Aware Testing of Digital VLSI Circuits and Systems by Santanu Chattopadhyay
Assuming a reading speed of 250 words per minute. Learn more
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
Thermal-Aware Testing of Digital VLSI Circuits and Systems by Santanu Chattopadhyay is 94 pages long, and a total of 23,876 words.
This makes it 32% the length of the average book. It also has 29% more words than the average book.
The average oral reading speed is 183 words per minute. This means it takes 2 hours and 10 minutes to read Thermal-Aware Testing of Digital VLSI Circuits and Systems aloud.
Thermal-Aware Testing of Digital VLSI Circuits and Systems is suitable for students ages 10 and up.
Note that there may be other factors that effect this rating besides length that are not factored in on this page. This may include things like complex language or sensitive topics not suitable for students of certain ages.
When deciding what to show young students always use your best judgement and consult a professional.
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