How Long to Read Wafer-Level Testing and Test During Burn-In for Integrated Circuits

How Long Does it Take to Read Wafer-Level Testing and Test During Burn-In for Integrated Circuits?

It takes the average reader 3 hours and 24 minutes to read Wafer-Level Testing and Test During Burn-In for Integrated Circuits by Sudarshan Bahukudumbi

Assuming a reading speed of 250 words per minute. Learn more

Description

Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias reliability stress test used in detecting and screening out potential early life device failures. This hands-on resource provides a comprehensive analysis of these methods, showing how wafer-level testing during burn-in (WLTBI) helps lower product cost in semiconductor manufacturing. Engineers learn how to implement the testing of integrated circuits at the wafer-level under various resource constraints. Moreover, this unique book helps practitioners address the issue of enabling next generation products with previous generation testers. Practitioners also find expert insights on current industry trends in WLTBI test solutions.

How long is Wafer-Level Testing and Test During Burn-In for Integrated Circuits?

Wafer-Level Testing and Test During Burn-In for Integrated Circuits by Sudarshan Bahukudumbi is 198 pages long, and a total of 51,084 words.

This makes it 67% the length of the average book. It also has 62% more words than the average book.

How Long Does it Take to Read Wafer-Level Testing and Test During Burn-In for Integrated Circuits Aloud?

The average oral reading speed is 183 words per minute. This means it takes 4 hours and 39 minutes to read Wafer-Level Testing and Test During Burn-In for Integrated Circuits aloud.

What Reading Level is Wafer-Level Testing and Test During Burn-In for Integrated Circuits?

Wafer-Level Testing and Test During Burn-In for Integrated Circuits is suitable for students ages 12 and up.

Note that there may be other factors that effect this rating besides length that are not factored in on this page. This may include things like complex language or sensitive topics not suitable for students of certain ages.

When deciding what to show young students always use your best judgement and consult a professional.

Where Can I Buy Wafer-Level Testing and Test During Burn-In for Integrated Circuits?

Wafer-Level Testing and Test During Burn-In for Integrated Circuits by Sudarshan Bahukudumbi is sold by several retailers and bookshops. However, Read Time works with Amazon to provide an easier way to purchase books.

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