How Long to Read Defect Oriented Testing for CMOS Analog and Digital Circuits

How Long Does it Take to Read Defect Oriented Testing for CMOS Analog and Digital Circuits?

It takes the average reader 5 hours and 25 minutes to read Defect Oriented Testing for CMOS Analog and Digital Circuits by Manoj Sachdev

Assuming a reading speed of 250 words per minute. Learn more

Description

Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate. Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives. Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field. `A strength of this book is its breadth. Types of designs considered include analog and digital circuits, programmable logic arrays, and memories. Having a fault model does not automatically provide a test. Sometimes, design for testability hardware is necessary. Many design for testability ideas, supported by experimental evidence, are included.' ... from the Foreword by Vishwani D. Agrawal

How long is Defect Oriented Testing for CMOS Analog and Digital Circuits?

Defect Oriented Testing for CMOS Analog and Digital Circuits by Manoj Sachdev is 317 pages long, and a total of 81,469 words.

This makes it 107% the length of the average book. It also has 100% more words than the average book.

How Long Does it Take to Read Defect Oriented Testing for CMOS Analog and Digital Circuits Aloud?

The average oral reading speed is 183 words per minute. This means it takes 7 hours and 25 minutes to read Defect Oriented Testing for CMOS Analog and Digital Circuits aloud.

What Reading Level is Defect Oriented Testing for CMOS Analog and Digital Circuits?

Defect Oriented Testing for CMOS Analog and Digital Circuits is suitable for students ages 12 and up.

Note that there may be other factors that effect this rating besides length that are not factored in on this page. This may include things like complex language or sensitive topics not suitable for students of certain ages.

When deciding what to show young students always use your best judgement and consult a professional.

Where Can I Buy Defect Oriented Testing for CMOS Analog and Digital Circuits?

Defect Oriented Testing for CMOS Analog and Digital Circuits by Manoj Sachdev is sold by several retailers and bookshops. However, Read Time works with Amazon to provide an easier way to purchase books.

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