How Long to Read Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

How Long Does it Take to Read Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits?

It takes the average reader 5 hours and 38 minutes to read Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by Manoj Sachdev

Assuming a reading speed of 250 words per minute. Learn more

Description

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

How long is Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits?

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by Manoj Sachdev is 328 pages long, and a total of 84,624 words.

This makes it 111% the length of the average book. It also has 103% more words than the average book.

How Long Does it Take to Read Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits Aloud?

The average oral reading speed is 183 words per minute. This means it takes 7 hours and 42 minutes to read Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits aloud.

What Reading Level is Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits?

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits is suitable for students ages 12 and up.

Note that there may be other factors that effect this rating besides length that are not factored in on this page. This may include things like complex language or sensitive topics not suitable for students of certain ages.

When deciding what to show young students always use your best judgement and consult a professional.

Where Can I Buy Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits?

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by Manoj Sachdev is sold by several retailers and bookshops. However, Read Time works with Amazon to provide an easier way to purchase books.

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