It takes the average reader 5 hours and 13 minutes to read Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs by Ruijing Shen
Assuming a reading speed of 250 words per minute. Learn more
Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips. This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs by Ruijing Shen is 306 pages long, and a total of 78,336 words.
This makes it 103% the length of the average book. It also has 96% more words than the average book.
The average oral reading speed is 183 words per minute. This means it takes 7 hours and 8 minutes to read Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs aloud.
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs is suitable for students ages 12 and up.
Note that there may be other factors that effect this rating besides length that are not factored in on this page. This may include things like complex language or sensitive topics not suitable for students of certain ages.
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