It takes the average reader 2 hours and 46 minutes to read Statistical Performance Characterization and Analysis of Nano-scale VLSI Circuits by Ruijing Shen
Assuming a reading speed of 250 words per minute. Learn more
To improve parametric yield, not only efficient algorithms are required to accurately predict the performance of a circuit, but also efficient techniques are highly desirable for chip design. Toward this direction, a novel voltage binning technique is proposed in the last part of the dissertation. The proposed method makes it possible to predict maximum bin numbers required under the uniform binning scheme, and model the optimal binning scheme as a set-cover problem. To achieve the same yield as the uniform approach, the proposed method can significantly save the number of bins and only takes very small CPU time cost.
Statistical Performance Characterization and Analysis of Nano-scale VLSI Circuits by Ruijing Shen is 164 pages long, and a total of 41,656 words.
This makes it 55% the length of the average book. It also has 51% more words than the average book.
The average oral reading speed is 183 words per minute. This means it takes 3 hours and 47 minutes to read Statistical Performance Characterization and Analysis of Nano-scale VLSI Circuits aloud.
Statistical Performance Characterization and Analysis of Nano-scale VLSI Circuits is suitable for students ages 10 and up.
Note that there may be other factors that effect this rating besides length that are not factored in on this page. This may include things like complex language or sensitive topics not suitable for students of certain ages.
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